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2020

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vol. 18 / 

Issue 2

 



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S. V. Dmitriiev, V. B. Molodkin, M. H. Tolmachov, S. Y. Olikhovskyi, V. V. Lizunov
«The Influence of Defects of Second Type by Krivoglaz to Coherent Component of X-Rays Scattering in Monocrystalline Materials of Nanoindustry»
253–264 (2020)

PACS numbers: 61.05.cc, 61.05.cf, 61.05.cp, 61.46.Hk, 61.72.Dd, 61.72.Lk, 81.07.Bc

The effect of defects on the coherent component of differential reflectivity is considered in the case of asymmetric Bragg x-ray diffraction geometry for single crystals. The possibility of a significant improvement of the diagnostic capabilities of phase-variational dynamical diffractometry is shown. This is due to the influence of experimental conditions on the manifestation of large defects in the scattering pattern and is especially effective in the case of asymmetric diffraction. The possibility of separating of the contributions of various-type defects to the diffracted intensity by choosing the optimal experimental conditions is demonstrated.

Keywords: dynamical diffraction, asymmetric diffraction, coherent scattering, x-ray diffractometric diagnostics

https://doi.org/10.15407/nnn.18.02.253

References
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