Выпуски

 / 

2009

 / 

том 7 / 

выпуск 2

 



Скачать полную версию статьи (в PDF формате)

Yu. P. GOMZA, V. V. KLEPKO, S. D. NESIN, E. A. LYSENKOV, Yu. A. KUNYTS’KY, M. Yu. BARABASH, and L. G. KHOMENKO
«X-Ray Examinations of Short-Range Ordering of Ultra-thin Films »
0411–0419 (2009)

PACS numbers: 07.85.Jy, 61.05.cp, 61.41.Vx, 68.47.Pe, 68.55.am, 68.55.J-, 81.70.Pg

Technique for investigation of short-range ordering in ultrathin epitaxial films is realized using standard x-ray DRON-2.0 diffractometer in the geometry of parallel gliding beams under conditions of total external reflection. Peculiarities of short-range ordering in polymer and inorganic films of 200–500 nm in thickness on various substrates are studied.

©2003—2019 NANOSISTEMI, NANOMATERIALI, NANOTEHNOLOGII G. V. Kurdyumov Institute for Metal Physics of the National Academy of Sciences of Ukraine.
E-mail: tatar@imp.kiev.ua Phones and address of the editorial office About the collection User agreement