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Yu. P. GOMZA, V. V. KLEPKO, S. D. NESIN, E. A. LYSENKOV, Yu. A. KUNYTS’KY, M. Yu. BARABASH, and L. G. KHOMENKO
«X-Ray Examinations of Short-Range Ordering of Ultra-thin Films »
411–419 (2009)

PACS numbers: 07.85.Jy, 61.05.cp, 61.41.Vx, 68.47.Pe, 68.55.am, 68.55.J-, 81.70.Pg

Technique for investigation of short-range ordering in ultrathin epitaxial films is realized using standard x-ray DRON-2.0 diffractometer in the geometry of parallel gliding beams under conditions of total external reflection. Peculiarities of short-range ordering in polymer and inorganic films of 200–500 nm in thickness on various substrates are studied.