Structure
INSTITUTE OF METAL PHYSICS OF NASU.
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EXPERIMENTAL APPARATUS


Ultrahigh-vacuum device for solid analysis by secondary ion mass spectrometry

Basic elements:
  • Liquid metal primary ion source with working substance from Ga or In
  • mass analyser
  • manipulator
  • vacuum system

Technical parameters:

  • Mass number range: (1–350) a.u.m.
  • Primary ion energy: (1–10) KeV
  • Mass resolution: 1 М (mass number range 1–210 a.u.m.)
                             0,5 М (mass number range 4–350 a.u.m.)
  • Ion beam diameter: 10 microns