INSTITUTE OF METAL PHYSICS OF NASU.

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HISTORY AND SCIENTIFIC ACTIVITY

The Laboratory was founded in April, 1993, on the base of the Special Department of X-ray Equipment of the reorganized Experimental Engineering-and-Technical Bureau (EETB) with Pilot Production of the Institute for Metal Physics, A.S. of Ukraine. The Can. of Sci. (Techn.) V.V.Petkov headed the Laboratory from 1993 till 1997. Since 1998, Dr. Sci. (Phys. & Math.), Prof. Ye. M. Kyslovskyi has been heading the Laboratory.

The main research direction of the Laboratory is creation and practical application of scientific research of devices and units to realize new diagnostic techniques of monocrystalline materials using the synchrotron radiation (SR), proposed at the Solid State Theory Department and other subdivisions of the Institute.

It was not accidental to choose the Experimental Engineering-and-Technical Bureau (EETB) with Pilot Production as a base for foundation of the Laboratory. Among its previous developments are devices and units which were used for the experiments on the SR beams long before the foundation of the Laboratory. Thus, the tried-and-true high-temperature X-ray unit УРВТ-2055 has been used for researching of the materials in solid and liquid states at the SR source in Novosibirsk (Russia) since 1986 (V.V.Petkov, A.V. Polenur). The following developments of the department, such as a high-temperature X-ray diffractometer ДАРВ-01 with a horizontal axis (V.V. Petkov, Ya.V. Novostavskyi), an automatic goniometer (V.V. Petkov, Ya.V. Novostavskyi), an energy-dispersive diffractometer ЭДД-01 to research the structure and composition of the materials (A.V.Polenur, Ye.I.Bersudskyi, R.R.Karpov, N.I.Dziublenko) became the base for the created set of devices for materials` diagnostics using the SR, designing of which began in 1989 for the SR source in Zelenograd (Russia). The set of devices consists of:

collimators (Ya.V. Novostavskyi, L.A.Velichko) which provide formation of the primary and monochromatic beams of rectangular cross-section with maximum sizes 2x10 mm. The change discreteness of sizes vertically is 0.01 mm, horizontally is 0.05 mm;
the monochromator (Ya.V. Novostavskyi, V.P.Podorozhnyi, Ye.N.Bersudskyi), providing extraction of the demanded wave length out of a continuous spectrum of the SR source by the constant monochromatic beam position;
the automatic X-ray diffractometer (V.V.Petkov, A.P.Kucherenko, A.V.Polenur, Ye.I.Bersudskyi), providing a simultaneous registration of the X-ray transmission pattern by methods of angular and energy dispersion; a low-temperature X-ray chamber.

In 1991 the energy analyzer of the scattered SR within the X-ray wavelength range (A.V.Polenur, R.R.Karpov) was developed and produced. It consists of: an original device for positioning of the semiconductor detector БДРК-Е-1К with the control element and precision high-speed spectrometer including an impulse processor, a high-speed ADC with buffer storage and a computer of the IBM PC/AT type. The energy analyzer was produced to the order of the Institute for Physical Problems (Zelenograd, Russia) and operates on the SR source in Novosibirsk.

The Laboratory solves the problems on conducting of the experimental research of the dynamic effects in diffuse scattering (DS) and processes of its interaction with Bragg component; checking of the main conclusions of the generalized dynamic theory of scattering and created on its basis of the new physical models, founding out of a number of physical regularities of the X-rays` diffraction with combined deformation fields; development of the high–sensitive and high–resolution integral and differential X-ray diffraction methods for the quantitative diagnostic of the defects` characteristics.

As a result a diffractometer complex of a new generation was created. It received a National Scientific Patrimony of Ukraine Status (Regulation of the Cabinet of Ministers of Ukraine dtd 19/12/2001 No. 1709), on which there were realized the X-ray diffraction methods using the dynamic effects DS and effects of its interaction with Bragg scattering component for nondestructive quantitative control of microdefects characteristics and for complicated cases as well. To a number of such diagnostic techniques refer: differential and integral methods and new variants of integral triple-crystal X-ray diffraction, the method of total rocking curves, X-ray diffraction method to control the dislocation content and methods to control local elastic deformation, structural homogeneity of the single crystal wafers and depth of the disturbed surface layers. A high–resolution (three-axis), four-circle automatic diffractometer was produced to register the curves of the diffraction reflection. It is equipped with the original X-ray optic schemes, providing the resolution within the scattering plane dq »2 ang. sec. and Dl/l » 5?10^-7(T.P.Vladimirova). The new physical models and methodological principles were developed for the high- resolution dynamic methods of a new generation triple-crystal diffractometry for adequate quantitative diagnostics of a real defect structure of the single crystal materials (O.V. Reshetnyk). The methodology, algorithms and computer software for the high-resolution X-ray diffraction quantitative diagnostics of the multi-layer structures with the quantum wells, superstructures with self-arranged lattices of the quantum dots were created (Ye. S.Skakunova).

The obtained scientific results were summarized in 1 Doctor Thesis (Ye.N. Kyslovskyi, 2000) and 6 Candidate`s Theses (T.P. Vladimirova, 2000; Ye.S. Skakunova, 2005, O.V.Reshetnyk, 2005; R.F.Seredenko, 2008; V.V.Molodkin, 2012; Ya.V. Vasylyk, 2013).

The task of the Laboratory is to use the developed in the Solid State Theory Department of theoretical developments to create modern devices as the separate stations for realization of the new diagnostic techniques. It is foreseen that in the future the main priority of the Laboratory will be participation in such studies as:

creation of the neutron diffractometer channel for diffusion-dynamic and small angle diffractometry in the different diffraction conditions including a glancing incidence diffraction and a reflectometry;
development of the new methods for multiparametric nanodiagnostics of the layed system;
experimental realization of the phase-contrast X-ray diffraction topography of the non-crystalline materials.