2Technical Centre, N.A.S. of Ukraine, 13, Pokrovska Str., UA-04070 Kyiv, Ukraine
Influence of Cr3+ and Mn2+ Activators on the Surface Morphology Formation of ZnGa2O4 Thin Films Obtained by RF Ion-Plasma Sputtering
489–502 (2026)
PACS numbers: 68.35.Ct, 68.37.Ps, 68.47.Gh, 68.55.J-, 81.15.Cd, 81.16.Pr, 81.65.Mq
Received 19 May, 2026
The surface morphology of zinc gallate (ZnGa2O4) thin films doped with Mn2+ and Cr3+ ions, obtained by RF ion-plasma sputtering on fused quartz (υ-SiO2) substrates, is analyzed. The influence of the activator type on the values of statistical surface-roughness parameters, grain sizes, and the nature of their distribution is investigated, using atomic force microscopy (AFM). As established, as-deposited ZnGa2O4:Mn films possess a fine-grained structure with pronounced nanopeaks (with coefficient of kurtosis Ska = 6.4), whereas ZnGa2O4:Cr films are characterized by larger grains and higher root-mean-square (RMS) roughness. As shown, thermal treatment leads to an increase in the grain size of the investigated samples. The results are explained, based on the crystallochemical features of the substitution of Zn2+ and Ga3+ ions by Mn2+ and Cr3+ ions in the corresponding positions of the spinel crystal structure.
KEY WORDS: zinc gallate, manganese activator, chromium activator, thin films, crystallites, surface morphology, AFM, thin-film annealing
REFERENCES
- Yan Jin-Liang, Zhao Yin-Nü, and Li Chao, Chin. Phys. B, 23, No. 4: 048105 (2014); https://doi.org/10.1088/1674-1056/23/4/048105
- Wei-Kai Wang, Kuo-Feng Liu, Sung‐Yu Wang, Jian-Cheng Guo, and Shih-Yung Huang, Semicond. Sci. Technol., 36: 055011 (2021); https://doi.org/10.1088/1361-6641/abefa2
- Samiran Bairagi, Ching-Lien Hsiao, Roger Magnusson, Jens Birch, Jinn P. Chu, Fu-Gow Tarntair, Ray-Hua Horng, and Kenneth Järrendahl, Optical Materials Express., 12, No. 8: 3284 (2022); https://doi.org/10.1364/OME.462668
- Su-Hua Yang, Chien-Yuan Lu, and Shoou-Jinn Chang, Journal of The Electrochemical Society, 154, No. 8: J229 (2007); https://doi.org/10.1149/1.2740027
- Jia-Hang Liu, Lei Li, Fan Zhang, Ya-Ping Qi, Zhen-Ping Wu, and Wei-Hua Tang, Phys. Scr., 99: 055538 (2024); https://doi.org/10.1088/1402-4896/ad3b4f
- L.-C. Cheng, C.-Y. Huang, and R.-H. Horng, Journal of the Electron Devices Society, 6: 432 (2018); https://doi.org/10.1109/JEDS.2018.2803078
- Chengling Lu, Qingyi Zhang, Shan Li, Zuyong Yan, Zeng Liu, Peigang Li and Weihua Tang, J. Phys. D: Appl. Phys., 54: 405107 (2021); https://doi.org/10.1088/1361-6463/ac1465
- Anqi Guo, Lichun Zhang, Ning Cao, Taiping Lu, Yadan Zhu, Dan Tian, Zhiying Zhou, Shunli He, Bin Xia, and Fengzhou Zhao, Appl. Phys. Express, 16, No. 2: 021004 (2023); https://doi.org/10.35848/1882-0786/acb98c
- Ray-Hua Horng, Peng-Hsuan Huang, Yun-Sheng Li, Fu-Gow Tarntair, and Chih Shan Tan, Appl. Surf. Sci., 555: 149657 (2021); https://doi.org/10.1016/j.apsusc.2021.149657
- Wanmin Lin, Dan Zhang, Sixian Liu, Yuqiang Li, Wei Zheng, and Feng Huang, Mater. Lett., 283: 128805 (2021); https://doi.org/10.1016/j.matlet.2020.128805
- Anoop Kumar Singh, Shiau-Yuan Huang, Po-Wei Chen, Jung-Lung Chiang, and Dong-Sing Wuu, Nanomaterials, 11: 2316 (2021); https://doi.org/10.3390/nano11092316
- Chia-Hsun Chen, Shu-Bai Liu, and Sheng-Po Chang, ACS Omega, 9, Iss. 13: 15304 (2024); https://doi.org/10.1021/acsomega.3c09965
- Yi-Siang Shen, Wei-Kai Wang, and Ray-Hua Horng, Journal of the Electron Devices Society, 5, Iss. 2: 112 (2017); doi:10.1109/JEDS.2017.2653419
- Kiyotaka Wasa, Makoto Kitabatake, and Hideaki Adachi, Thin Film Materials Technology: Sputtering of Compound Materials (New York: William Andrew Inc. publishing–Springer-Verlag GmbH&Co. KG: 2004).
- O. M. Bordun, I. Yo. Kukharskyy, and V. G. Bihday, J. Appl. Spectrosc., 78, No. 6: 922 (2012); https://doi.org/10.1007/s10812-012-9555-9
- Yan Liu, Tingting Zheng, Xiuyun Zhang, and Chen Chen, Scientific Reports, 13: 14430 (2023); https://doi.org/10.1038/s41598-023-41658-5
- Shigeaki Ono, John P. Brodholt, and G. David Price, Phys. Chem. Miner., 35: 381 (2008); https://doi.org/10.1007/s00269-008-0231-9
- D. Errandonea, Ravhi S. Kumar, F. J. Manjón, V. V. Ursaki, and E. V. Rusu, Phys. Rev. B, 79: 024103 (2009); https://doi.org/10.1103/PhysRevB.79.024103
- O. M. Bordun, I. I. Medvid, I. Y. Kukharskyy, M. V. Protsak, I. O. Bordun, I. M. Kofliuk, and K. L. Biliak, Molecular Crystals and Liquid Crystals, 769, Nos. 7–8: 801 (2025); https://doi.org/10.1080/15421406.2025.2504059
- Aurélie Bessière, Sylvaine Jacquart, Kaustubh Priolkar, Aurélie Lecointre, Bruno Viana, and Didier Gourier, Optics Express., 19, Iss. 11: 10132 (2011); https://doi.org/10.1364/OE.19.010131
- K. Somasundaram, K. P. Abhilash, V. Sudarsan, P. Christopher Selvin, and R. M. Kadam, Physica B, 491: 79 (2016); http://dx.doi.org/10.1016/j.physb.2016.03.022
- Pawel Pawlus, Rafal Reizer, and Wieslaw Zelasko, Materials, 16, No. 22: 7109 (2023); https://doi.org/10.3390/ma16227109
- B. Rajesh Kumar and T. Subba Rao, Digest Journal of Nanomaterials and Biostructures, 7, No. 4: 1881 (2012); https://www.researchgate.net/publication/279702126_AFM_studies_on_surface_morphology_topography_and_texture_of_nanostructured_zinc_aluminum_oxide_thin_films
- E. S. Gadelmawla, M. M. Koura, T. M. A. Maksoud, I. M. Elewa, and H. H. Soliman, Journal of Materials Processing Technology, 123, Iss. 1: 133 (2002); https://doi.org/10.1016/S0924-0136(02)00060-2
- James Egbu, Paul R. Ohodnicki, Jr., John P. Baltrus, Ahmed Talaat, Ruishu F. Wright, and Michael E. McHenry, Journal of Alloys and Compounds, 912: 165155 (2022); https://doi.org/10.1016/j.jallcom.2022.165155
- B. Rajesh Kumar, B. Hymavathi, and T. Subba Rao, Materials Today: Proceedings, 4: 8638 (2017); https://doi.org/10.1016/j.matpr.2017.07.212
- M. K. Hussen and F. B. Dejene., Optik., 181: 514 (2019); https://doi.org/10.1016/j.ijleo.2018.12.121
- O. M. Bordun, I. O. Bordun, I. M. Kofliuk, I. Yo. Kukharskyy, I. I. Medvid, Zh. Ya. Tsapovska, and D. S. Leonov, Nanosistemi, Nanomateriali, Nanotehnologii, 20, Iss. 1: 91 (2022); https://doi.org/10.15407/nnn.20.01.91
- O. M. Bordun, I. I. Medvid, І. Yo. Kukharskyy, I. O. Bordun, M. V. Protsak, V. G. Bihday, I. S. Kuz, A. I. Tyslyuk, R. V. Pavlius, and D. S. Leonov, Nanosistemi, Nanomateriali, Nanotehnologii, 22, Iss. 4: 823 (2024); https://doi.org/10.15407/nnn.22.04.823
- O. M. Bordun, I. O. Bordun, I. I. Medvid, M. V. Protsak, I. Yo. Kukharskyy, V. G. Bihday, I. M. Kofliuk, I. Yu. Khomyshyn, and D. S. Leonov, Nanosistemi, Nanomateriali, Nanotehnologii, 21, Iss. 4: 709 (2023); https://doi.org/10.15407/nnn.21.04.709
- O. M. Bordun, B. O. Bordun, I. Yo. Kukharskyy, I. I. Medvid, I. I. Polovynko, Zh. Ya. Tsapovska, and D. S. Leonov, Nanosistemi, Nanomateriali, Nanotehnologii, 19, Iss. 1: 159 (2021); https://doi.org/10.15407/nnn.19.01.159
- O. M. Bordun, B. O. Bordun, I. I. Medvid, M. V. Protsak, I. Yo. Kukharskyy, K. L. Biliak, D. M. Maksymchuk, I. M. Kofliuk, and D. S. Leonov, Nanosistemi, Nanomateriali, Nanotehnologii, 22, No. 1: 1 (2024); https://doi.org/10.15407/nnn.22.01.001
- Wei-Kai Wang, Kuo-Feng Liu, Pi-Chuen Tsai, Yi-Jie Xu, and Shih-Yung Huang, Coatings, 9, Iss. 12: 859 (2019); https://doi.org/10.3390/coatings9120859
- O. M. Bordun, V. G. Bihday, І. Yo. Kukharskyy, І. І. Medvid, І. М. Kofliuk, I. Yu. Khomyshyn, Zh. Ya. Tsapovska, and D. S. Leonov, Nanosistemi, Nanomateriali, Nanotehnologii, 21, Iss. 2: 403 (2023); https://doi.org/10.15407/nnn.21.02.403
- G. Perfetti, T. Alphazana, P. van Hee, W. J. Wildeboer, and G. M. H. Meesters, European Journal of Pharmaceutical Sciences, 42, Iss. 3: 262 (2011); https://doi.org/10.1016/j.ejps.2010.12.001