Collection of scientific works Nanosystems, nanomaterials, nanotechnologies
Year 2025 Volume 23, Issue 3
Download the full version of the article (PDF) Open Access

Fouad Zuhair RAZZOOQI1, Mohammed S. RADHI2, Hayder Abbas SALLAL3, and Zainab AL-KHAFAJI4,5

1Al-Qasim Green University, Al-Qasim District, Babylon Governorate, 51013 Babylon, Iraq
2College of Materials Engineering, Ceramic and Building Materials Department, University of Babylon, Hillah, Iraq
3College of Engineering, Department of Prosthetics and Orthotics Engineering, Al-Nahrain University, Jadriya, Baghdad, Iraq
4Faculty of Engineering and Built Environment, Department of Civil Engineering, Universiti Kebangsaan Malaysia, 43600 UKM Bangi, Selangor, Malaysia
5Imam Ja'afar Al-Sadiq University, Qahira, Baghdad, Iraq

High Optical Transmittance of TiO2 Thin Films Prepared by Sol–Gel Coating Technique

719–732 (2025)

PACS numbers: 78.20.Ci, 78.20.Jq, 78.40.Ha, 78.66.Li, 78.67.Bf, 81.20.Fw, 81.40.Tv

Received 8 March, 2024

In this paper, thin titanium-dioxide films are prepared with sol–gel processing, and the effect of annealing-temperature variations on some optical properties (n, k, d) is investigated. Thin films are determined using the ellipsometry technique, considering the effect of annealing temperatures of 360°C, 460°C, 550°C, and 700°C. By using a spectrophotometer (UV–Vis), the optical properties are determined. As found, the best values of optical transmittance are obtained for the annealed film at 500°C (the spectrophotometric curve at issue is showing the largest transmittance of the visible length, reaching between 80% and 90% at wavelengths ranging from 400 nm to 600 nm, respectively). The best values of reflectance and refractive index appear at T ≈ 460°C and T ≈ 500°C, as the films show low reflectance values in the visible region 400–700 nm. It should be noted that the annealed film at a temperature of 500°C is the best. All films have a wide band gap of 3.2 eV as obtained for all samples prepared, especially, at T ≈ 500°C.

KEY WORDS: sol–gel processing, thin films, optical transmittance

DOI: https://doi.org/10.15407/nnn.23.03.0719

Citation:
Fouad Zuhair Razzooqi, Mohammed S. Radhi, Hayder Abbas Sallal, and Zainab Al-Khafaji, High Optical Transmittance of TiO2 Thin Films Prepared by Sol–Gel Coating Technique, Nanosistemi, Nanomateriali, Nanotehnologii, 23, No. 3: 719–732 (2025); https://doi.org/10.15407/nnn.23.03.0719
REFERENCES
  1. M. Pelaez, N. T. Nolan, S. C. Pillai, M. K. Seery, P. Falaras, A. G. Kontos, P. S. Dunlop, J. W. Hamilton, J. A. Byrne, K. O'shea, and M. H. Entezari, Appl. Catal. B: Environ., 125, No. 1: 331 (2012); https://doi.org/10.1016/j.apcatb.2012.05.036
  2. B. Al-Zubaidy, N. S. Radhi, and Z. S. Al-Khafaji, Int. J. Mech. Eng. Technol., 10, No. 1: 776 (2019).
  3. S. Sattar, Y. Alaiwi, N. S. Radhi, and Z. Al-Khafaji, Acad. J. Manuf. Eng., 21, No. 4: 86 (2023).
  4. Sabaa Sattar, Yaser Alaiwi, Nabaa Sattar Radhi, Zainab Al-Khafaji, Osamah Al-Hashimi, Hassan Alzahrani, and Zaher Mundher Yaseen, J. King Saud Univ. Sci., 35, No. 8: 102861 (2023); https://doi.org/10.1016/j.jksus.2023.102861
  5. Mauricio E. Calvo, José R. Castro Smirnov, and Hernán Míguez, J. Polym. Sci. Part B: Polym. Phys., 50, Iss. 14: 945 (2012); https://doi.org/10.1002/polb.23087
  6. Nabaa S. Radhi, Ahlam Hamid Jasim, Zainab S. Al-Khafaji, and Mayadah Falah, Nanosistemi, Nanomateriali, Nanotehnologii, 21, Iss. 4: 769 (2023); https://doi.org/10.15407/nnn.21.04.769
  7. S. Ghosh and A. P. Das, Toxicol. Environ. Chem., 97, No. 5: 491 (2015); https://doi.org/10.1080/02772248.2015.1052204
  8. Natarajan Shanmugam, Rishi Pugazhendhi, Rajvikram Madurai Elavarasan, Pitchandi Kasiviswanathan, and Narottam Das, Energies, 13, Iss. 10: 2631 (2020); https://doi.org/10.3390/en13102631
  9. H. A. Sallal, M. S. Radhi, M. H. Mahboba, and Z. Al-Khafaji, Egypt. J. Chem., 55, No. 6: 197 (2023); https://doi.org/10.21608/EJCHEM.2022.154630.6684
  10. Chen Yang, Huiqing Fan, Yingxue Xi, Jin Chen, and Zhuo Li, Appl. Surf. Sci., 254, Iss. 9: 2685 (2008); https://doi.org/10.1016/j.apsusc.2007.10.006
  11. M. N. Chaudhari, R. B. Ahirrao, and S. D. Bagul, IJRASET, 9, No. 1: 5215 (2021).
  12. N. D. Fahad, N. S. Radhi, Z. S. Al-Khafaji, and A. A. Diwan, Heliyon, 9, No. 3: 14103 (2023); https://doi.org/10.1016/j.heliyon.2023.e14103
  13. I. Karaduman Er, S. Uysal, A. Ateş, and S. Acar, J. Mater. Sci. Mater. Electron., 34, No. 20: 1512 (2023); https://doi.org/10.1007/s10854-023-10930-9
  14. X. Yu, T. J. Marks, and A. Facchetti, Nat. Mater., 15, No. 4: 383 (2016); https://doi.org/10.1038/nmat4599
  15. Timothy J. Coutts, Thomas O. Mason, John D. Perkins, and David S. Ginley, Proc. Electrochem. Soc., 99, No. 1999: 274 (1999).
  16. Jianyu Fu, Wenjuan Xiong, Haiping Shang, Ruiwen Liu, Junfeng Li, Weibing Wang, Wenwu Wang, and Dapeng Chen, Mater. Sci. Semicond. Process, 89, No. 1: 1 (2019); https://doi.org/10.1016/j.mssp.2018.08.024
  17. S. M. Sze and K. K. Ng, Physics of Semiconductor Devices (John Wiley & Sons, Inc.: 2006); https://doi.org/10.1002/0470068329
  18. Bing Zhou, Xiaohong Jiang, Zhubo Liu, Ruiqi Shen, and Aleksandr V. Rogachev, Mater. Sci. Semicond. Process, 16, No. 2: 513 (2013); https://doi.org/10.1016/j.mssp.2012.05.001
  19. S. H. Woo and C. K. Hwangbo, Surf. Coat. Technol., 201, Nos. 19–20: 8250 (2007); https://doi.org/10.1016/j.surfcoat.2006.01.085
  20. H. S. Nalwa, Handbook of Thin Films (Five-Volume Set) (Academic Press: 2001).
  21. X. Tian, X. Cui, T. Lai, J. Ren, Z. Yang, M. Xiao, B. Wang, X. Xiao, and Y. Wang, NMS, 3, No. 4: 390 (2021); https://doi.org/10.1016/j.nanoms.2021.05.011
  22. N. K. Elumalai, M. A. Mahmud, D. Wang, and A. Uddin, Energies, 9, No. 11: 861 (2016); https://doi.org/10.3390/en9110861
  23. T. Wen, J. Gao, J. Shen, and Z. Zhou, J. Mater. Sci., 36, No. 1: 5923 (2001); https://doi.org/10.1023/A:1012989012840
  24. E. Traversa, G. Gnappi, A. Montenero, and G. Gusmano, Sens. Actuators B: Chem., 31, Nos. 1–2: 59 (1996); https://doi.org/10.1016/0925-4005(96)80017-7
  25. Robert Alan May, Ellipsometric and Nanogravimetric Porosimetry Studies of Nanostructured, Mesoporous Electrodes (Dissertation for Doctor of Philosophy) (The University of Texas at Austin: 2009).
  26. F. Scheepers, A. Stähler, M. Stähler, M. Carmo, W. Lehnert, and D. Stolten, JCTR, 16, No. 1: 1213 (2019); https://doi.org/10.1007/s11998-019-00206-5
  27. J. Ben Naceur, M. Gaidi, F. Bousbih, R. Mechiakh, and R. Chtourou, Curr. Appl. Phys., 12, Iss. 2: 422 (2012); https://doi.org/10.1016/j.cap.2011.07.041
  28. X. Zhang, Y. Zhang, Y. Wang, Q. Wang, Z. Liu, R. Geng, H. Wang, W. Jiang, and W. Ding, J. Alloys Compd., 929, No. 1: 167278 (2022); https://doi.org/10.1016/j.jallcom.2022.167278
  29. S. Banerjee, E. Adhikari, P. Sapkota, A. Sebastian, and S. Ptasinska, Mater., 13, No. 13: 2931 (2020); https://doi.org/10.3390/ma13132931
  30. Yu-Hsiang Wang, Kazi Hasibur Rahman, Chih-Chao Wu, and Kuan-Chung Chen, Catalysts, 10, No. 6: 598 (2020); https://doi.org/10.3390/catal10060598
  31. N. Mozaffari, S. H. Elahi, S. S. Parhizgar, N. Mozaffari, and S. M. Elahi, MRX, 6, No. 11: 116428 (2019); https://doi.org/10.1088/2053-1591/ab4662
  32. Fubao Zhang, Xianming Wang, Haonan Liu, Chunli Liu, Yong Wan, Yunze Long, and Zhongyu Cai, Applied Sciences, 9, No. 12: 2489 (2019); https://doi.org/10.3390/app9122489
  33. V. T. Lukong, K. Ukoba, and T. C. Jen, Int. J. Adv. Manuf. Technol., 122, Nos. 9–10: 3525 (2022); https://doi.org/10.1007/s00170-022-10043-3
  34. J. I. Larruquert, Optical Properties of Thin Film Materials at Short Wavelengths. Optical Thin Films and Coatings (Elsevier: 2018), p. 291–356; https://doi.org/10.1016/B978-0-08-102073-9.00007-2
  35. X. Teng, B. Liu, and T. Ichiye, Chem. Phys., 153, No. 10 (2020); https://doi.org/10.1063/5.0021472
  36. A. J. Haider, A. A. Najim, and M. A. H. Muhi, Opt. Commun., 370, No. 1: 263 (2016); https://doi.org/10.1016/j.optcom.2016.03.034
  37. O. Y. Ramírez-Esquivel, D. A. Mazón-Montijo, Z. Montiel-González, and F. S. Aguirre-Tostado, Sol. Energy Mater. Sol. Cells, 185: 392 (2018); https://doi.org/10.1016/j.solmat.2018.05.029