NNN 2025, Vol. 23, No. 1, pp. 101–108 Abstract
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Nanosistemi, Nanomateriali, Nanotehnologii Collection Year 2025 Vol. 23, Issue 1
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O.M. BORDUN, I.I. MEDVID, I.Yo. KUKHARSKYY, V.G. BIHDAY, I.O. BORDUN, I.M. KOFLIUK, Zh.Ya. TSAPOVSKA, and D.S. LEONOV

Light Dispersion in Thin Films of ZnGa2O4:Cr3+ and ZnGa2O4:Mn2+ Obtained by RF Ion-Plasma Sputtering

101–108 (2025)

PACS numbers: 61.72.Ff, 61.72.Mm, 68.37.Ps, 68.55.J-, 78.20.Ci, 78.66.Li, 81.15.Cd

Thin films of ZnGa2O4:Cr3+ and ZnGa2O4:Mn2+ are obtained by high-frequency (RF) ion-plasma sputtering in an argon atmosphere. The surface morphology is studied by AFM, and the sizes of nanocrystallites forming the films are analysed. Based on the interference technique, the refractive index is determined. As found, in films of both types in the visible region, a normal dispersion of the refractive index is observed. The analysis of the single-oscillator three-parameter model used to describe the dispersion dependence is carried out, and the static refractive index n0, the characteristic energy E0, the approximation parameter A, and the plasma-oscillations' energy for valence electrons ℏωp are determined.

KEY WORDS: zinc gallate, thin films, RF sputtering, surface morphology, refractive index dispersion

DOI:  https://doi.org/10.15407/nnn.23.01.0101

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