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AHMED HASHIM and M.H. ABBAS

Exploring the Dielectric Properties of PVP/Ag/SiC Nanostructures to Use in Various Electronics Fields
187–195 (2024)

PACS numbers: 72.80.Tm, 77.22.Ch, 77.22.Gm, 77.55.+f, 77.84.Lf, 81.07.Pr, 82.35.Np

This work objects to fabrication of PVP/Ag/SiC nanostructures and investigation of the dielectric properties to use them in various electronics applications with lightweight and low cost. The results demonstrate that the dielectric constant and dielectric loss of PVP/Ag/SiC nanostructures are reduced, while the electrical conductivity is increased with an increase in the frequency. The dielectric constant, dielectric loss, and electrical conductivity are increased with an increase of the concentration. Finally, the results of dielectric properties indicate that the PVP/Ag/SiC nanostructures can be suitable in dif-ferent electronics fields

KEY WORDS: polyvinylpyrrolidone, Ag/SiC, nanostructures, dielectric properties, electronics fields

DOI:  https://doi.org/10.15407/nnn.22.01.187

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