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I. M. Pazukha, R. M. Petrenko, Yu. O. Shkurdoda, A. M. Lohvynov, V. V. Shchotkin, S. R. Dolgov-Gordiichuk, L. V. Dekhtyaruk
«Electrical Conductivity and Magnetoresistive Properties of Layered Structures Based on Fe and SiO»
0035–0043 (2021)
PACS numbers: 72.25.-b, 72.80.Tm, 73.50.Jt, 75.47.-m, 81.15.Jj, 82.80.Pv, 85.75.-d
The experimental results on electrical conductivity and magnetoresistive properties of layered structures based on Fe and SiO prepared by layer-by-layer electron-beam condensation method are presented. As demonstrated, the value of resistivity depends on the effective thickness of Fe layers. It is associated with the size-effect appearance in thin-film materials. For as-deposited and annealed structures, the magnetoresistive effect has anisotropic character, and its value does not exceed 0.1% at room temperature.
Keywords: layer-by-layer condensation, electrical conduction, temperature coefficient of resistance, magnetoresistive properties
https://doi.org/10.15407/nnn.19.01.035
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