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V. B. Molodkin, A. I. Nizkova, E. I. Bogdanov, S. V. Dmitriev, V. V. Lizunov, E. S. Skakunova, N. G. Tolmachev, Y. V. Vasylyk, A. G. Karpov, O. G. Voitok, V. P. Pochekuev
«Creation of the Integrated Dynamical Diffractometry Basics for Micro- and Nanoinhomogeneities of Crystal Structure with Defects and Disturbed Surface Layer»
261–275 (2017)

PACS numbers: 61.05.C-, 61.72.Dd, 61.72.J-, 62.82.Fk, 68.35.Ct, 81.07.-b, 85.40.-e

Based on the use of observed effects of the asymmetry of an azimuthal dependence of a total integrated intensity of a dynamical diffraction, approach is developed and practically implemented for the non-destructive diagnostics of a profile of the inhomogeneous distribution of micro-defects in single crystals. In particular, for the first time, the distribution profile for microdefects (precipitates and dislocation loops without restrictions on their sizes) over a depth of dynamically scattering layer of a single crystal is obtained. A principal possibility of kinetics determination is shown, and the kinetics of changing of such layer complex structure after high-energy electron processing is actually determined.

Key words: x-rays, total integral intensity, dynamical scattering, doublecrystal diffractometer, disturbed surface layer, large defects, azimuthaldependence asymmetry.

https://doi.org/10.15407/nnn.15.02.0261

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