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V. A. Artemyuk, L. I. Karbivska, E. Ya. Kuznetsova, V. L. Karbivskyy The influences of temperature-annealing processes on the surface morphological features and the electronic structure of a metal Fe82Si4B14 alloy in the temperature range from 200?C to 700?C are investigated by methods of both the probe scanning tunnelling microscopy and the atomic resolution spectroscopy. Low-conductivity areas are observed after the relaxation of disordered alloy that is typical for the formation of Fe–Si and Fe–B nanophases. The substantial inhomogeneities of the electron density of states at the intercluster boundaries that indicates their complex organization. Distribution of the electron density of states near the Fermi level is determined. Coagulation of cluster assemblies and, as a result, the formation of nano- and mesoparticles are observed. Key words: amorphous metallic alloy, electronic structure, surface morphology, thermal annealing, scanning tunnelling microscopy. https://doi.org/10.15407/nnn.15.02.0251 REFERENCES 1. N. Kobayashi, N. Kataoka, T. Shima, and H. Fujimori, J. Magn. Magn. Mater., 129, No. 3: 302 (1994). 2. V. A. Blagojevic, D. M. Minic, M. V. Dragica, and M. Minic, Mater. Chem. Phys., 142, No. 1: 207 (2013). https://doi.org/10.1016/j.matchemphys.2013.07.007 3. A. Macheta, A. Galtayries, S. Zanna, L. Klein, V. Maurice, P. Jolivet, M. Foucault, P. Combrade, P. Scott, and P. Marcus, Electrochim. Acta., 49, No. 22: 3957 (2004). https://doi.org/10.1016/j.electacta.2004.04.032 4. B. Reinker, H. Geisler, M. Moske, and K. Samwer, Thin Solid Films, 275, No. 1: 240 (1996). https://doi.org/10.1016/0040-6090(95)07053-2 5. A. Boutahar, H. Lassri, E. K. Hlil, and D. Fruchart, J. Magn. Magn. Mater., 398, No. 1: 26 (2016). 6. X. C. Zhong, H. C. Tian, S. S. Wang, Z. W. Liu, Z. G. Zheng, and D. C. Zeng, J. Alloys Compd., 633, No. 2: 188 (2015). 7. J. Nogues, K. V. Rao, A. Inoue, and K. Suzuki, NsM, 5, No. 3: 281 (1995). https://doi.org/10.1016/0965-9773(95)00248-D 8. M. Donten, Z. Stojek, and H. Cesiulis, J. Electrochem. Soc., 150, No. 2: C95 (2003). https://doi.org/10.1149/1.1536994 9. C. J. Chen, Introduction to Scanning Tunneling Microscopy. 1st Edition (New York: Oxford University Press: 1993). |
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