Скачать полную версию статьи (в PDF формате)

R. I. Bihun, Z. V. Stasiuk, O. V. Strohanov, M. D. Buchkovska, V. M. Havryliukh, Ia. A. Pastyrskyi, and D. S. Leonov
«Influence of Sublayers of Germanium on Metallization of Films of Silver»
015–026 (2017)


PACS numbers: 72.10.Fk, 73.23.Ad, 73.25.+i, 73.50.Bk, 73.61.At, 73.63.Bd, 81.15.Kk

Electronic conduction in silver films deposited on bare glass surface and glass surface predeposited with germanium underlayers under ultrahigh vacuum conditions is investigated. Ultrathin germanium underlayers (with mass thickness of 0.5–5 nm) accelerate the silver-films’ metallization and reduce the threshold thickness of percolation transition. As shown, the major changes in kinetic coefficients of studied silver films are observed, if the germanium mass thickness is less than 2 nm. The resistivity–size dependences are explained within the scope of the model approximations of dimensional effects.

Key words: thin metal films, percolation threshold, dimensional effect, charge surface scattering, ballistic electronic transport.

https://doi.org/10.15407/nnn.15.01.0015

REFERENCES

1. R. I. Bihun, M. D. Buchkovska, N. S. Koltun, Z. V. Stasiuk, and D. S. Leonov, Metallofiz. Noveishie Tekhnol., 35, No. 1: 85 (2013) (in Ukrainian).
2. M. D. Buchkovska, Fizyka ta Khimiya Poverkhni, 13, No. 4: 916 (2012) (in Ukrainian).
3. CRC Handbook of Chemistry and Physics (Ed. D. R. Lide) (Boca Raton, FL: CRC Press: 2005).
4. R. I. Bihun, M. D. Buchkovska, N. S. Koltun, Z. V. Stasiuk, and D. S. Leonov, Metallofiz. Noveishie Tekhnol., 35, No. 12: 1659 (2013) (in Ukrainian).
5. R. I. Bihun, Z. V. Stasyuk, and O. A. Balitskii, Physica B, 487: 73 (2016). Crossref