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M. Yu. Bobyk, V. P. Ivanitsky, M. M. Ryaboshchuk, and O. Ya. Svatyuk
«Different Electron-Scattering Mechanisms’ Contribution to the Formation of the Amplitude Contrast of Electron-Microscopic Images»
PACS numbers: 07.78.+s, 61.05.J-, 61.05.jd, 61.43.Dq, 68.37.Lp, 68.55.jd, 87.64.Ee
A new method of experimental determination of the amplitude contrast value of electron-microscopic images for amorphous materials is suggested. The mathematical relations for calculating the contributions of different mechanisms of electron scattering by the object under study to the contrast on the basis of the relevant electron-diffraction patterns are obtained. The shares of contribution of elastically coherently, elastically incoherently, and inelastically scattered electrons to the contrast are determined experimentally for the amorphous As40Se60 films.