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М. Ю. Бобик, В. П. Іваницький, В. С. Ковтуненко, В. І. Сабов
«Кількісні параметри стохастично нанонеоднорідної структури аморфних плівок системи Ge–Se»
0073–0088 (2013)

PACS numbers: 07.78.+s, 07.79.-v, 61.05.J-, 61.43.Er, 68.37.Lp, 87.64.Bx, 87.64.Ee

The quantitative parameters of Ge–Se amorphous films nanostructure: heterogeneity sizes, bumps heights and hollows depths of surface relief, diameters of grains or columns, the channels widths, nanopores size, degree of nanoporosity are determined by combination of both the electron microscopy and the atomic force microscopy. As revealed, the nanoinhomogeneities are realized due to the topography of the samples and their nanoporosity.

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