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Year 2012, Volume 10, Issue 2 |
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Выпуски/2012/том 10 /выпуск 2 |
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М. А. Цысарь
«Исследование стекла системы Ag2O–B2O3 методом сканирующей туннельной микроскопии с полупроводниковым алмазным остриём»
343–349 (2012)
PACS numbers: 07.79.Cz, 68.35.Ct, 68.37.Ef, 81.40.Pq, 81.65.Ps, 81.30.Tx
Investigation of Ag2O–B2O3 glass is presented. As established, the method of scanning tunnelling microscopy can be used to determine a surface quality. A case of step on boundary between glass and Ni interlayer is also considered
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